MSE 585 F20 Lecture 19 Module 3 - Introduction to TEM

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MSE 585 F20 Lecture 20 Module 2 - Bright- and Dark-Field in TEM

(10:52)

MSE 585 F20 Lecture 18 Module 5 - SEM Scanning

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MSE 585 F20 Lecture 21 Module 5 - Modern Advancements in TEM

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MSE 585 F20 Lecture 22 Module 2 - Basics of Photoelectrons

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MSE 585 F20 Lecture 15 - Module 1 - Introduction to X-ray Spectroscopy

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MSE 585 F20 Lecture 16 Module 2 - Wavelength-Dispersive Spectrum

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MSE 585 F20 Lecture 24 Module 4 - SIMS: Types of Mass Analyzers

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MSE 585 F20 Lecture 24 Module 3 - SIMS Instrumentation

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MSE 585 F20 Lecture 19 Module 4 - Comparing TEM to Other Microscopes

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MSE 585 F20 Lecture 24 Module 2 - SIMS: Types of Ion Interactions

(9:50)

MSE 585 F20 Lecture 23 Module 6 - XPS/AES: Quantification

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MSE 585 F20 Lecture 22 Module 1 - Introduction to Surface Characterization

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MSE 585 F20 Lecture 24 Module 5 - SIMS Spectra

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MSE 585 F20 Lecture 24 Module 1 - Basics of SIMS

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MSE 585 F20 Lecture 21 Module 2 - TEM SAD: Indexing Cubic Patterns Example

(19:46)

MSE 585 F20 Lecture 23 Module 4 - XPS/AES: Surface Charging

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MSE 585 F20 Lecture 23 Module 2 - XPS Spectra

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MSE 585 F20 Lecture 23 Module 1 - XPS/AES Spectra Identification

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